Advantest Unveils MTe – Unified, Scalable Test Platform for Power Semiconductor Devices

Flexible Platform Spans from Wafer to High-End Power Module Testing

TOKYO, Oct. 30, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the MTe power test platform. The cutting-edge MTe redefines test efficiency and scalability to address test requirements for the fast-growing power semiconductor market.

Increasing market demand for electrification across automotive, industrial, renewable energy, telecommunication and data infrastructure applications is pushing semiconductor manufacturers to achieve higher performance and lower cost of test (CoT). The MTe platform responds to these needs by combining modular hardware architecture, ultimate system scalability and advanced digital control, redefining the standard in power semiconductor test performance and efficiency.

“The MTe concept embodies our vision of making test easy by being scalable, flexible and sustainable,” said Fabio Marino, managing director, CREA, an Advantest Group Company. “We provide our customers with a unified test solution that evolves with their production requirements, enabling a seamless transition from R&D to high-volume manufacturing, ensuring the highest levels of performance and reliability.”

Designed with state-of-the-art Advantest technology, MTe provides significant footprint reduction and optimized resource distribution without performance degradation—a key enabler to attract major IDM and OSAT players. The MTe platform is able to address emerging wide-bandgap semiconductor (e.g., SiC and GaN) challenges, as well as the integration of digital IP cores on power devices (e.g., IPM and IPD), providing high bandwidth capture, best-in-class gate driver control, dynamic (and short-circuit) test up to 10kA, and flexible high-voltage digital capabilities.

Aligned with Advantest's history of providing scalable test platforms, MTe distributed computing architecture provides significant multisite test efficiency, enabling a high-parallel-test solution with optimized throughput. The MTe platform is now available worldwide. Early evaluations by customers in automotive and industrial power applications have confirmed significant productivity and throughput gains compared with legacy testers.

Note to Editors:
IP: Intellectual property
IDM: Integrated device manufacturer
OSAT: Outsourced semiconductor assembly & test
SiC: Silicon carbide
GaN: Gallium nitride
IPM: Intelligent power module
IPD: Integrated power device

About Advantest Corporation
Advantest (TSE: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductors for applications including 5G communications, the Internet of Things (IoT), autonomous vehicles, high-performance computing (HPC), including artificial intelligence (AI) and machine learning, and more. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. The company also conducts R&D to address emerging testing challenges and applications; develops advanced test-interface solutions for wafer sort and final test; produces scanning electron microscopes essential to photomask manufacturing; and offers system-level test solutions and other test-related accessories. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. More information is available at www.advantest.com.

ADVANTEST CORPORATION
3061 Zanker Road
San Jose, CA 95134, USA
Cassandra Koenig
cassandra.koenig@advantest.com

A photo accompanying this announcement is available at https://www.globenewswire.com/NewsRoom/AttachmentNg/21043222-e50d-4397-a951-7a56e3b466c4

MTe Complete Solution

Complete portfolio for the new MTe power test system line

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